Melvin A. Breuer: search on Z-Library

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1

Combinatorial equivalence of (0, 1) circulant matrices

Melvin A. Breuer

Journal:

Journal of Computer and System Sciences

Year:

1969

Language:

english

File:

PDF, 599 KB

english, 1969

2

The Borel-Tanner Distribution

Frank A. Haight and Melvin Allen Breuer

Journal:

Year:

1960

File:

PDF, 652 KB

1960

3

A Knowledge-Based System for Designing Testable VLSI Chips

Abadir, Magdy, Breuer, Melvin

Journal:

IEEE Design & Test of Computers

Year:

1985

Language:

english

File:

PDF, 14.50 MB

english, 1985

4

[ACM Press the 33rd annual conference - Las Vegas, Nevada, United States (1996.06.03-1996.06.07)] Proceedings of the 33rd annual conference on Design automation conference - DAC '96 - Lower bounds on test resources for scheduled data flow graphs

Parulkar, Ishwar, Gupta, Sandeep K., Breuer, Melvin A.

Year:

1996

Language:

english

File:

PDF, 302 KB

english, 1996

5

Digital Systems Testing and Testable Design || Testing for Bridging Faults

Abramovici, Miron, Breuer, Melvin A., Friedman, Arthur D.

Year:

1994

File:

PDF, 3 KB

1994

6

Digital Systems Testing and Testable Design || Testing for Bridging Faults

Abramovici, Miron, Breuer, Melvin A., Friedman, Arthur D.

Year:

1994

File:

PDF, 3 KB

1994

7

Digital Systems Testing and Testable Design || Fault Modeling

Abramovici, Miron, Breuer, Melvin A., Friedman, Arthur D.

Year:

1994

Language:

english

File:

PDF, 3.30 MB

english, 1994

8

The formulation of some allocation and connection problems as integer programs

Melvin A. Breuer

Journal:

Naval Research Logistics (NRL)

Year:

1966

Language:

english

File:

PDF, 626 KB

english, 1966

9

An unexpected result in coding the vertices of a graph

Melvin A Breuer, Jon Folkman

Journal:

Journal of Mathematical Analysis and Applications

Year:

1967

Language:

english

File:

PDF, 736 KB

english, 1967

10

An optimum testing algorithm for some symmetric coherent systems

Salam Salloum, Melvin A Breuer

Journal:

Journal of Mathematical Analysis and Applications

Year:

1984

Language:

english

File:

PDF, 1.29 MB

english, 1984

11

An optimal scheduling algorithm for testing interconnect using boundary scan

Jung-Cheun Lien, Melvin A. Breuer

Journal:

Journal of Electronic Testing

Year:

1991

Language:

english

File:

PDF, 1.07 MB

english, 1991

12

The probability of error detection in sequential circuits using random test vectors

Asad A. Ismaeel, Melvin A. Breuer

Journal:

Journal of Electronic Testing

Year:

1991

Language:

english

File:

PDF, 836 KB

english, 1991

13

Test program synthesis for modules and chips having boundary scan

Jung-Cheun Lien, Melvin A. Breuer

Journal:

Journal of Electronic Testing

Year:

1993

Language:

english

File:

PDF, 1.91 MB

english, 1993

14

Generating a family of testable designs using the BILBO methodology

Sen-Pin Lin, Charles A. Njinda, Melvin A. Breuer

Journal:

Journal of Electronic Testing

Year:

1993

Language:

english

File:

PDF, 1.58 MB

english, 1993

15

Partial scan design of register-transfer level circuits

Rajesh Gupta, Melvin A. Breuer

Journal:

Journal of Electronic Testing

Year:

1995

Language:

english

File:

PDF, 2.12 MB

english, 1995

16

Estimation of BIST Resources During High-Level Synthesis

Ishwar Parulkar, Sandeep K. Gupta, Melvin A. Breuer

Journal:

Journal of Electronic Testing

Year:

1998

Language:

english

File:

PDF, 377 KB

english, 1998

17

Allocation Techniques for Reducing BIST Area Overhead of Data Paths

Ishwar Parulkar, Sandeep K. Gupta, Melvin A. Breuer

Journal:

Journal of Electronic Testing

Year:

1998

Language:

english

File:

PDF, 563 KB

english, 1998

18

An IEEE 1149.1 Compliant Test Control Architecture

Debaditya Mukherjee, Melvin A. Breuer

Journal:

Journal of Electronic Testing

Year:

1998

Language:

english

File:

PDF, 170 KB

english, 1998

19

TA-PSV—Timing Analysis for Partially Specified Vectors

Liang-Chi Chen, Sandeep K. Gupta, Melvin A. Breuer

Journal:

Journal of Electronic Testing

Year:

2002

Language:

english

File:

PDF, 355 KB

english, 2002

20

Test Generation for Crosstalk-Induced Faults: Framework and Computational Results

Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer

Journal:

Journal of Electronic Testing

Year:

2002

Language:

english

File:

PDF, 226 KB

english, 2002

21

Self-diagnosis of regular arrays of processors

Farhad Saheban, Melvin Breuer

Journal:

Computers & Electrical Engineering

Year:

1992

Language:

english

File:

PDF, 874 KB

english, 1992

22

A Note on Three-Valued Logic Simulation

Breuer, Melvin A.

Journal:

IEEE Transactions on Computers

Year:

1972

Language:

english

File:

PDF, 535 KB

english, 1972

23

Identification of Multiple Stuck-Type Faults in Combinational Networks

Breuer, Melvin A., Chang, Shih-Jeh, Su, Stephen Y. H.

Journal:

IEEE Transactions on Computers

Year:

1976

Language:

english

File:

PDF, 2.56 MB

english, 1976

24

On Area and Yield Considerations for Fault-Tolerant VLSI Processor Arrays

Koren, Israel, Breuer, Melvin A.

Journal:

IEEE Transactions on Computers

Year:

1984

Language:

english

File:

PDF, 1.69 MB

english, 1984

25

Implementation of Threshold Nets by Integer Linear Programming

Breuer, Melvin A.

Journal:

IEEE Transactions on Electronic Computers

Year:

1965

Language:

english

File:

PDF, 586 KB

english, 1965

26

Generation of optimal code for expressions via factorization

Breuer, Melvin A.

Journal:

Communications of the ACM

Year:

1969

Language:

english

File:

PDF, 804 KB

english, 1969

27

[IEEE 2012 13th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2012.03.19-2012.03.21)] Thirteenth International Symposium on Quality Electronic Design (ISQED) - Theory of redundancy for logic circuits to maximize yield/area

Mirza-Aghatabar, Mohammad, Breuer, Melvin A., Gupta, Sandeep K., Nazarian, Shahin

Year:

2012

Language:

english

File:

PDF, 616 KB

english, 2012

28

[IEEE 2006 International Conference on Intelligent Information Hiding and Multimedia - Pasadena, CA, USA (2006.12.18-2006.12.18)] 2006 International Conference on Intelligent Information Hiding and Multimedia - Error-Tolerance and Multi-Media

Breuer, Melvin, Zhu, Haiyang

Year:

2006

Language:

english

File:

PDF, 257 KB

english, 2006

29

[IEEE 9th Annual Symposium on Switching and Automata Theory (swat 1968) - Schenedtady, NY, USA (1968.10.15-1968.10.18)] 9th Annual Symposium on Switching and Automata Theory (swat 1968) - Fault detection in a linear cascade of identical machines

Breuer, Melvin A.

Year:

1968

Language:

english

File:

PDF, 1.02 MB

english, 1968

30

[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - Using Explicit Output Comparisons for Fault Tolerant Scheduling (FTS) on Modern High-Performance Processors

Gao, Yue, Gupta, Sandeep K., Breuer, Melvin A.

Year:

2013

Language:

english

File:

PDF, 1.26 MB

english, 2013

31

[IEEE Conference Publications Design Automation and Test in Europe - Grenoble, France (2013.03.18-2013.03.22)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 - A New Paradigm for Trading Off Yield, Area and Performance to Enhance Performance per Wafer

Gao, Yue, Breuer, Melvin A., Wang, Yanzhi

Year:

2013

Language:

english

File:

PDF, 352 KB

english, 2013

32

[IEEE 2009 Asian Test Symposium - Taichung, Taiwan (2009.11.23-2009.11.26)] 2009 Asian Test Symposium - SIRUP: Switch Insertion in RedUndant Pipeline Structures for Yield and Yield/Area Improvement

Mirza-Aghatabar, Mohammad, Breuer, Melvin A., Gupta, Sandeep K.

Year:

2009

Language:

english

File:

PDF, 626 KB

english, 2009

33

[IEEE 2009 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2009.04.28-2009.04.30)] 2009 International Symposium on VLSI Design, Automation and Test - An efficient multi-phase test technique to perfectly prevent over-detection of acceptable faults for optimal yield improvement via error-tolerance

Hsieh, Tong-Yu, Lee, Kuen-Jong, Breuer, Melvin A.

Year:

2009

Language:

english

File:

PDF, 259 KB

english, 2009

34

[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Improving Timing-Independent Testing of Crosstalk Using Realistic Assumptions on Delay Faults

Irajpour, Shahdad, Gupta, Sandeep K., Breuer, Melvin A.

Year:

2007

Language:

english

File:

PDF, 491 KB

english, 2007

35

[IEEE 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2008.04.23-2008.04.25)] 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - A systematic methodology to employ error-tolerance for yield improvement

Hsieh, Tong-Yu, Lee, Kuen-Jong, Lu, Chia-Lin, Breuer, Melvin A.

Year:

2008

Language:

english

File:

PDF, 182 KB

english, 2008

36

[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan (2006.11.20-2006.11.20)] 2006 15th Asian Test Symposium - Test Generation for Weak Resistive Bridges

Irajpour, Shahdad, Gupta, Sandeep, Breuer, Melvin

Year:

2006

Language:

english

File:

PDF, 373 KB

english, 2006

37

[IEEE 26th IEEE VLSI Test Symposium (vts 2008) - San Diego, CA, USA (2008.04.27-2008.05.1)] 26th IEEE VLSI Test Symposium (vts 2008) - Basing Acceptable Error-Tolerant Performance on Significance-Based Error-rate (SBER)

Pan, Zhaoliang, Breuer, Melvin A.

Year:

2008

Language:

english

File:

PDF, 398 KB

english, 2008

38

A methodology for custom VLSI layout

Breuer, Melvin A., Kumar, Anshul

Journal:

IEEE Transactions on Systems Man and Cybernetics

Year:

1983

Language:

english

File:

PDF, 1.43 MB

english, 1983

39

[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - HYPER: A Heuristic for Yield/Area imProvEment Using Redundancy in SoC

Mirza-Aghatabar, Mohammad, Breuer, Melvin A., Gupta, Sandeep K.

Year:

2010

Language:

english

File:

PDF, 354 KB

english, 2010

40

[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan (2006.11.20-2006.11.20)] 2006 15th Asian Test Symposium - Diagnosis of delay faults due to resistive bridges, delay variations and defects

Wang, Lei, Gupta, Sandeep, Breuer, Melvin

Year:

2006

Language:

english

File:

PDF, 257 KB

english, 2006

41

[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Reduction of Detected Acceptable Faults for Yield Improvement via Error-Tolerance

Hsieh, Tong-Yu, Lee, Kuen-Jong, Breuer, Melvin A.

Year:

2007

Language:

english

File:

PDF, 268 KB

english, 2007

42

[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - A design flow to maximize yield/area of physical devices via redundancy

Mirza-Aghatabar, Mohammad, Breuer, Melvin A., Gupta, Sandeep K.

Year:

2012

Language:

english

File:

PDF, 1.07 MB

english, 2012

43

[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Algorithms to maximize yield and enhance yield/area of pipeline circuitry by insertion of switches and redundant modules

Mirza-Aghatabar, Mohammad, Breuer, Melvin A, Gupta, Sandeep K

Year:

2010

Language:

english

File:

PDF, 328 KB

english, 2010

44

[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Tolerance of performance degrading faults for effective yield improvement

Hsieh, Tong-Yu, Breuer, Melvin A., Annavaram, Murali, Gupta, Sandeep K., Lee, Kuen-Jong

Year:

2009

Language:

english

File:

PDF, 192 KB

english, 2009

45

[IEEE 2008 1st IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems (NDCS 2008) - Cambridge, MA (2008.09.29-2008.09.30)] 2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems - Ones Counting Based Error-Rate Estimation for Multiple Output Circuits

Pan, Zhaoliang, Breuer, Melvin A.

Year:

2008

Language:

english

File:

PDF, 205 KB

english, 2008

46

[ACM Press the 30th international - Dallas, Texas, United States (1993.06.14-1993.06.18)] Proceedings of the 30th international on Design automation conference - DAC '93 - An efficient partitioning strategy for pseudo-exhaustive testing

Srinivasan, Rajagopalan, Gupta, Sandeep K., Breuer, Melvin A.

Year:

1993

Language:

english

File:

PDF, 820 KB

english, 1993

47

Error Rate Estimation for Defective Circuits via Ones Counting

Pan, Zhaoliang, Breuer, Melvin A.

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

2012

Language:

english

File:

PDF, 215 KB

english, 2012

48

Introducing redundant computations in RTL data paths for reducing BIST resources

Parulkar, Ishwar, Gupta, Sandeep K., Breuer, Melvin A.

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

2001

Language:

english

File:

PDF, 747 KB

english, 2001

49

[ACM Press the SHARE design automation project - Not Known (1966..-..)] Proceedings of the SHARE design automation project on - DAC '66 - The application of integer programming in design automation

Breuer, Melvin A

Year:

1966

Language:

english

File:

PDF, 730 KB

english, 1966

50

[ACM Press the 31st annual conference - San Diego, California, United States (1994.06.06-1994.06.10)] Proceedings of the 31st annual conference on Design automation conference - DAC '94 - Extraction of a high-level structural representation from circuit descriptions with applications to DFT/BIST

Parulkar, Ishwar, Breuer, Melvin A., Njinda, Charles A.

Year:

1994

Language:

english

File:

PDF, 565 KB

english, 1994

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